Cookies Policy

This site uses cookies. By continuing to browse the site you are agreeing to our use of cookies.

I accept this policy

Find out more here

A versatile Fraunhofer diffraction and Mie scattering based laser particle sizer

No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
The full text of this article is not currently available.

Brill’s MyBook program is exclusively available on BrillOnline Books and Journals. Students and scholars affiliated with an institution that has purchased a Brill E-Book on the BrillOnline platform automatically have access to the MyBook option for the title(s) acquired by the Library. Brill MyBook is a print-on-demand paperback copy which is sold at a favorably uniform low price.

This Article is currently unavailable for purchase.
Add to Favorites
You must be logged in to use this functionality

Cover image Placeholder

Many commercially available laser particle sizers based on the Fraunhofer diffraction technique are now widely used for particle size measurement. Theoretical analysis and numerical calculations have shown that errors may be involved when this type of instrument is used for small particle measurements. An improvement could be made when classical Mie's scattering theory is applied in the small size range. Based on this idea, a Fraunhofer diffraction and Mie scattering (FAM) laser particle sizer has been constructed. Experiments made with a Photomask calibration reticle and latex spheres show that FAM gives very good measurement in both large and small size ranges.

Affiliations: 1: Department of Power Engineering, Shanghai Institute of Mechanical Engineering, 516 Jun Gong Road, Shanghai 200093, PRC; 2: Department of Chemical Engineering, Zhejiang University, Hangzhou 310027, PRC


Full text loading...


Data & Media loading...

Article metrics loading...



Can't access your account?
  • Key

  • Full access
  • Open Access
  • Partial/No accessInformation