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A versatile Fraunhofer diffraction and Mie scattering based laser particle sizer

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Many commercially available laser particle sizers based on the Fraunhofer diffraction technique are now widely used for particle size measurement. Theoretical analysis and numerical calculations have shown that errors may be involved when this type of instrument is used for small particle measurements. An improvement could be made when classical Mie's scattering theory is applied in the small size range. Based on this idea, a Fraunhofer diffraction and Mie scattering (FAM) laser particle sizer has been constructed. Experiments made with a Photomask calibration reticle and latex spheres show that FAM gives very good measurement in both large and small size ranges.

Affiliations: 1: Department of Power Engineering, Shanghai Institute of Mechanical Engineering, 516 Jun Gong Road, Shanghai 200093, PRC; 2: Department of Chemical Engineering, Zhejiang University, Hangzhou 310027, PRC

10.1163/156855292X00025
/content/journals/10.1163/156855292x00025
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/content/journals/10.1163/156855292x00025
2017-09-19

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